Showing results: 256 - 270 of 734 items found.
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GX5641 Series -
Marvin Test Solutions, Inc.
The GX5641 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), functional test, and factory automation applications. The GX5641 consists of 64 bi-directional TTL-differential I/O channels. Each channel has two ports (TTL and differential) which can be individually set to operate in either conversion or static I/O modes.
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Sifos Technologies, Inc.
The optional PSL-3424-QT feature license opens up two important productivity tools in the PSL-3424 platform. PSL-3424 Quick Test is a fully automated PSE functional test covering between 2 and 8 PSE ports in a test cycle with average test times on the order of 10 seconds per port tested. The Chained Data Test user interface allows rapid construction and verification of test setups used in “snaked data path” testing of PSE’s with user specified loads and optional LLDP power negotiation on each test port.
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RocketSim -
Cadence Design Systems
Complementing compiled-code simulators, Cadence® RocketSim™ parallel simulation engine eliminates functional verification bottlenecks by speeding up simulation using commonly available multi-core servers. The engine is proven for register-transfer level (RTL) system on chip (SoC), gate-level functional simulation, and gate-level design for test (DFT) simulation in numerous marquee systems and semiconductor companies in the mobile, server, and graphics domains. Ever-growing chip density and complexity slow down simulation, making functional verification a severe bottleneck. As a result, chip design projects miss their time-to-market targets, or designers end up taping out early with less confidence. RocketSim parallel simulation engine solves the bottleneck common in existing compiled-code simulators by offloading the time-consuming calculations to an ultrafast multi-core engine.
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Joule Technologies
Joule''s strength is in the design and manufacture of functional test fixtures. Using 3D modeling software to create the fixtures allows us to actuate pneumatics, open and close overclamps, actuate side access units - all before a single part has been machined for the fixture.
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AccelQ -
accelQ
*Automates test design and execution with a focus on business process*Enables manual testers and business analysts to automate without the need for programming*Ensures design-first approach with inbuilt modularity; No need for custom frameworks.*Enables early automation with industry first virtualized abstraction for functional testing
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6TL Engineering
Two pushers plate available for max. DUT areas: 450×450 and 500×650 mm 6tl precision servo pusher H7100 6000 is the recommended solution for PCB test systems combining Functional, In-Circuit, and Hipot Test in one fixture.It is available as a 19″ Rack atonomous module, including all drive, control and safety components for easy integration in automatic test systems using standard Mass Interconnection Receivers.
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MTQ Testsolutions AG
Control of Automated Test Equipment (ATE) for functional test and in-circuit testOperation of test facilities with adapters and PLCssemi- and fully automatic testing of electronic components and assembliesFinal Test in ProductionTest of pre-series and sample seriesStandardized test program developmentAdaptable to your own system environment (customizing) – 100% usable after installation with standard elements
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Telerik A.D.
Test Studio Dev Edition is a Visual Studio extension allowing software engineers to create functional automated UI tests in Visual Studio using C# or VB.NET. It is designed to provide ready-to-use Visual Studio automated testing functionality across web and desktop. Applications that are built with the Telerik and Kendo UI controls can be automated in a snap, by way of built-in native component translators.
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TR-069 -
QA Cafe
CDRouter TR-069 is an add-on module for CDRouter that provides test coverage for the Broadband Forum's CPE WAN Management Protocol (CWMP). CDRouter TR-069 incorporates a fully functional Auto-Configuration Server (ACS) and is designed to test a wide range of CWMP client implementations including Internet Gateway Devices (IGD) and LAN-side devices such as set-top boxes (STB) and voice over IP (VoIP) endpoints.
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GX5642 -
Terotest Systems Ltd.
The GX5642 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5642 consists of 64 bi-directional TTL-to-differential LVDS I/O channels. Each channel has two ports (TTL and LVDS) and can be individually set to operate in either conversion or static I/O modes.
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Novus, Novus-M, & Novus-R 100/25GE Load Modules -
Keysight Network Applications and Security
Novus, Novus-M, and Novus-R are Ixia’s next-generation architecture and test solutions that satisfy the test needs of both high-density, multi-rate switch/router makers and the organizations implementing the network equipment. Supporting eight native QSFP28 100GE ports and up to 32-ports for 25GE per load module, Novus load modules enable interoperability and functional testing, as well as high-port count performance testing.
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GX5642 -
Marvin Test Solutions, Inc.
The GX5642 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5642 consists of 64 bi-directional TTL-to-differential LVDS I/O channels. Each channel has two ports (TTL and LVDS) and can be individually set to operate in either conversion or static I/O modes.
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IG-XL -
Teradyne, Inc.
Teradyne’s award winning IG-XL software transforms test program development for the FLEX, UltraFLEX and J750 family of testers. Its powerful, yet easy-to-use, graphical environment lets engineers rapidly develop fully functional test programs, cutting program development and debugging time. Designed to address multisite complexity, IG-XL can convert single site test programs to multisite automatically, speeding time to market and reducing cost of test. With IG-XL, test engineers focus on actual testing, not writing code for the tester.
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JTAG Technologies Inc.
Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
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EDigital-Series™ -
Teradyne, Inc.
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
